JEOL Introduces New Series of Scanning Electron Microscopes

JEOL Introduces New Series of Scanning Electron Microscopes

Peabody, Mass., February 14, 2006 -JEOL USA, a leading supplier of scientific and analytical instruments, has introduced a new series of high resolution tungsten scanning electron microscopes (SEMs) featuring multiple live image displays, streamlined graphical interface, and improved low kV operation.

The new SEM series enables simultaneous observation of up to three different images (secondary electron, backscattered electron, and digital camera), on-screen measurement, and smart settings for simplified functionality. Secondary electron resolution is 3.0nm at 30kV, 8nm at 3kV, and 15nm at 1kV, and magnification ranges from 5 to 300,000X.

New electron optics enhance both general purpose imaging as well as analysis at the nanoscale. The new JSM-6390/6490 series comprises five models, offering a choice of low vacuum operation, three stage sizes for specimens up to 12" in size, and goniometer stage axis control. In addition, JEOL USA offers a wide range of specially-designed sample holders for its US customers.

JEOL is renowned for its extensive line of electron microscopes, including field emission SEMs, Transmission Electron Microscopes (TEMs), and now several new instruments designed for sample preparation, including an argon beam cross section polisher and a new single-column focused ion beam system.