News
New Glow Discharge cleaning system for TEM grids from Ted Pella
Next generation Silicon Dioxide flat support films from Ted Pella
New SEM Specimen mounts and holders introduced from Ted Pella
ClassOne Equipment launch a new website
JEOL SEM series launched at Pittcon
INCA Microanalysis
Tescan Distributors meeting
New CCD area image sensors
High Performance Raman and FTIR Just Got Easier
New XRF microscope provides ground breaking 10 Ám analysis
Sub Micron Analysis - Raman/AFM Hybrid Raman Technology
AFM for Leading-Edge Bioscience Research
Release of PictureFrame« 2.2 a new comprehensive camera control and image-processing software
XPlorer/Pursuit XS Microscope Digital Cameras
Optronics next generation of advanced scientific grade CCD imaging cameras
Nikon Introduces COOLSCOPE LOW-MAG Low Magnification for a Wider Field of View
Lumenera Corporation releases new 6.6 Megapixel infinity digital camera
Lumenera Corporation releases new high-sensitivity, cooled CCD digital camera
Carl Zeiss NTS and SII NanoTechnology announce global strategic alliance on Nanotechnology Solutions
JEOL Introduces New Series of Scanning Electron Microscopes
Retractable YAG BSED
Low Vacuum Secondary Tescan Detector
QuantomiX Signs Distribution Agreements with Major North American Distributors
Image-Pro Plus« Version 6.0 Includes Powerful Analysis Tools and Support for Windows XP x64
Microscopes from Carl Zeiss Once Again Chosen as Best Instruments of the Year in the USA
Nikon Announces LiveScan Next Generation Swept Field Confocal Microscope
Five New Scanning Systems for Biomedical Research
Bruker AXS Microanalysis Introduces a New Member of the QUANTAX EDS Family - QUANTAX QUAD
Combined MicroBeam XRF/EDS
INCASteel from Oxford Instruments
Oscillating Diamond Knife
NANOSENSORST introduces Q30K-Plus Silicon AFM probes for UHV applications
The BS-Gold Series

Terms of Use. Site Statistics. Copyright © 2010 by Henrik Kaker. All Rights Reserved.