Company Data
TSL/EDAX
392 East 12300 South Ste. H.
Draper, UT 84020
USA
Tel: 801-495-2750
Fax: 801-495-2758
Email   Website
Eexpertise in crystallographic characterizations: Backscatter Kikuchi diffraction (BKD)pattern analysis, EBSP Image Analysis, Grain Boundary Characterization and Mapping, Grain Size Characterization and Mapping, Local Orientation Mapping, Local Lattice Orientation, Microtexture Analysis and Mapping, Multiple Phase Identification and Mapping, Orientation Imaging Microscopy (OIM™) for both SEM and TEM, Automated Dark Field Diffraction Analysis in TEM for nanocrystalline thin films.

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