Company Data
392 East 12300 South Ste. H.
Draper, UT 84020
Tel: 801-495-2750
Fax: 801-495-2758
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Eexpertise in crystallographic characterizations: Backscatter Kikuchi diffraction (BKD)pattern analysis, EBSP Image Analysis, Grain Boundary Characterization and Mapping, Grain Size Characterization and Mapping, Local Orientation Mapping, Local Lattice Orientation, Microtexture Analysis and Mapping, Multiple Phase Identification and Mapping, Orientation Imaging Microscopy (OIM™) for both SEM and TEM, Automated Dark Field Diffraction Analysis in TEM for nanocrystalline thin films.

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