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Rue Jaquet-Droz 1
Neuchatel 2007
Phone: +41 (0)32 720 5085
Fax: +41 (0)32 720 5792
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NANOSENSORS™ recently introduced the AdvancedTEC™ sensors. This highly doped monolithic silicon sensor is designed for precise positioning and high resolution imaging. It features a rectangular cantilever with a triangular free end and a tetrahedral tip that protrudes from the very end of the cantilever. This unique feature allows precise positioning and makes the AdvancedTEC™ the only scanning probe in the world that offers real tip visibility through the optical system of the Atomic Force Microscope – even when the probe is slightly tilted due to its mounting. This makes it the premium choice for all applications where the tip has to be visible (e.g. nanomanipulation).

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