Company Data
Hitachi High Technologies America Inc.
Tel: 1 925 218 2800
Fax: 1 925 218 3230
Email   Website
Transmission electron microscopes, Field emission scanning electron microscopes, Scanning electron microscopes, Electron beam (EB) lithography systems, Focused ion beam systems Scanning electron microscopes used exclusively for measurment of critical dimensions (CD-SEM) and Ultra-thin Film Evaluation Systems.

Hitachi High Technologies Europe
  • Hitachi High Technologies Europe

  • Terms of Use. Site Statistics. Copyright © 2008 by Henrik Kaker. All Rights Reserved.