Company Data
HORIBA Jobin Yvon Inc.
3880 Park Avenue
Edison
NJ 08820-3012
USA
Phone: +1 -732-494-8660, Toll Free: +1-866-jobinyvon
Fax:+1 -732-549-5125
Email   Website
Atomic Spectroscopy: ICP/OES, Glow Discharge, Arc/Spark, Inorganic Standards
Detectors: Single Channel, Multichannel arrays, OEM, Imaging CCD.
Elemental Analysis: Carbon/Sulfur, Oxygen/Nitrogen & Hydrogen, Sulfur-in-Oil, Industrial XRF Analyzer, Micro-XRF Analyzer, WEEE/RoHS/ELV compliance testing.
Ellipsometry: Laser Ellipsometers, Spectroscopic Ellipsometers, Large Area Metrology.
Environmental Analysis: Carbon/Sulfur, Oxygen/Nitrogen & Hydrogen, Sulfur-in-Oil , Industrial XRF Analyzer, WEEE/RoHS/ELV, compliance testing.
Fluorescence: Steady State, Lifetime, Nanotechnology, Remote Sensing, Process Monitoring.
Forensic & Identification Systems: FLS - ALS Forensic Light Sources, RUVIS - Fingerprint Imager, Digital Imaging - Fingerprint Enhancement, AFIS & APIS, Analytical/Microscopy, Analytical XRF Microscope.
Gratings: Grating Catalog, Grating Equations, OEM.
Light Measurement: Spectrometers & Monochromators, Detectors, Acquisition Controllers Sources, Accessories, OEM.
Materials Characterization: Raman, PL, FT-IR, Ellipsometry, Micro-XRF Elemental Analyzer.
Microscopy: Raman Microscopy, Micro-PL, FT-IR, Micro-XRF Elemental Analyzer.
Nano-materials Characterization: Raman Microscopy, Fluorescence, Ellipsometry.
Particle Size Characterization: Particle Size Analyzers, Elemental Particle Size Analyzers.
Thin Film Process Equipment: Optical Emission Spectroscopy, Depth Targeting, Deep Etch Control, Cluster Tools, Real Time Plasma Analysis, Interface Detection.
Raman Spectroscopy: Analytical/Microscopy, Research/High Resolution, Process/Industrial.
Vacuum UV Spectroscopy: Monochromators & Spectrographs, Synchrotron Beamlines, Mirrors & Gratings, Slits.
X-Ray Fluorescence Analysis: Micro-XRF Elemental Analyzer, Industrial XRF Analyzer, WEEE/RoHS/ELV, compliance testing.


Terms of Use. Site Statistics. Copyright © 2008 by Henrik Kaker. All Rights Reserved.